Personal Statement Consideration for Promotion to Full Professor

Angela D. Davies Associate Professor Room 235A, Grigg Hall The Department of Physics and Optical Science The University of North Carolina at Charlotte Email: [email protected]

August 2013

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TABLE OF CONTENTS RESEARCH.................................................................................................................................................................................. 3  RESEARCH PERSONAL STATEMENT ............................................................................................................................................ 3  SIGNIFICANT ACTIVITIES AND CITATIONS .................................................................................................................................. 3  RESEARCH SUPPORT SUMMARY ................................................................................................................................................. 5  RESEARCH CAREER GOALS ........................................................................................................................................................ 6  RESEARCH SELF-EVALUATION ................................................................................................................................................... 6  TEACHING .................................................................................................................................................................................. 6  TEACHING PERSONAL STATEMENT ............................................................................................................................................ 6  INNOVATIVE ACTIVITIES ............................................................................................................................................................ 7  TEACHING CAREER GOALS ........................................................................................................................................................ 8  TEACHING SELF-EVALUATION.................................................................................................................................................... 8  SERVICE ...................................................................................................................................................................................... 9  SERVICE PERSONAL STATEMENT ............................................................................................................................................... 9  SERVICE SELF-EVALUATION .................................................................................................................................................... 10  REFERENCES ........................................................................................................................................................................... 11 

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RESEARCH Research Personal Statement My research is at the boundary between optical engineering and measurement science in the context of manufacturing and precision engineering. I research optical measurement techniques to characterize the geometry or optical performance of components. This is of interest to industries such as semiconductor IC manufacturing, precision optics manufacturing, aerospace, automotive, and measurement equipment manufacturers. The need for optical techniques for measurement (non-contact inspection) is growing as technology moves forward, pushing limits of component tolerance and specification. This drives a need to inspect a part accurately, quickly and without mechanical contact, and measurements based on light are often an ideal solution. There are few academic research programs with this focus, and the need for graduates with this expertise is strong and growing. Students working in my group are well prepared for careers in industry, and transition smoothly and quickly to work in areas such as quality control, process inspection, and metrology. The research falls under one or more of the following categories: (1) new measurement methods, (2) extending analysis methods or measurement capabilities, (3) establishing calibration methods, and (4) evaluating measurement uncertainty. These categories have been applied to the general areas of (i) micro-optics and micro-structure metrology and (ii) macro-scale optics and precision components.

Significant Activities and Citations In 1998 I made a significant career change and moved from the Physics Laboratory at NIST to the Manufacturing Engineering Laboratory. The new focus was on advancing measurement techniques and estimating measurement uncertainty for a range of precision measurements [1-7]. When I moved to Charlotte in 2001, my research continued in advancing optical measurement techniques for precision components and began to focus in two areas (i) micro-optic and micro-structure metrology and (ii) macroscale component metrology. The funding has come primarily from the National Science Foundation and the Center for Precision Metrology at UNC Charlotte. Publications and funding are referenced in the discussion that follows. Sample publications and a submitted book chapter are shown in Appendix A. Micro-optic and Micro-structure Metrology Micro-optic metrology was not a focus at NIST, yet there was a clear national need. This was an initial research concentration at Charlotte and I’ve continued this work over the years. Research at Charlotte began with measurements for micro-refractive lenses. These are lenses much like the lenses in a pair of glasses but with diameters less than a millimeter. Much of this research was funded through an NSF CAREER award [8], an NSF GOALI award [9], grants from the Center for Precision Metrology [1012], and grants from a private company [13, 14]. We researched and developed an instrument to measure micro-optics [15, 16]; researched instrument calibration methods for geometric shape [17-20], transmitted wavefront [21-23], and radius of curvature [24]; investigated sources of systematic biases [13, 14, 25-28]; and gave invited talks [29, 30]. We also extended micro-optics data analysis methods for a special class of micro-optics known as micro-aspheric lenses [31-33]. We researched systematic errors in measurements of general micro-scale components caused, for example, by the phase-change on reflection [34-37] and the slope (tilt) of the surface being measured [12]. The slope-dependent error work is still underway with current funding through the Center for Precision

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Metrology [10]. We have also researched methods of effectively measuring drift characteristics of instruments using a small spherical artifact [26]. Measurements on the micro-scale are often limited to parts that are relatively flat, yet there are many applications that call for micro-scale parts with steep height profiles. We researched a method of using an index-matching liquid for transmission measurements of micro-structures that allows an approximate measurement of steeply sloped components [38, 39]. The work mentioned above for measuring slopedependent errors will be continued to develop a method of using the calibration information to correct measurements [10, 27, 28]. A postdoc working in the group developed a method for removing a certain type of noise spike from interferometric microscopy data on steeply sloped components [40]. The work in the micro-regime led to research into characterizing the substrate dimensions using wavelength-scanning interferometry. This research involved working with a commercial interferometer we have at UNC Charlotte and extending the measurement capabilities to include absolute thickness measurements [11, 41-43]. Early work in the micro-structure regime initiated interest in the category of optical measurements called structured-light techniques. This category, unlike interferometry, allows one to extract surface geometry from looking at the shape of an optical pattern observed on or reflected from a surface. Our work began with structure-light measurements of solder bump arrays, a project funded through the Center for Precision Metrology and initiated by Intel [44-47]. We continued this work for measurements of larger scale components and it will be a primary research thrust in the future. Macro-scale Metrology Research at NIST led to a careful look at the uncertainty limits for using interferometry for measuring the radius of curvature of a precision component. The work continued at UNC Charlotte with funding through NIST and the Center for Precision Metrology at UNC Charlotte [48, 49]. The research led to publications and presentations in collaboration with NIST colleagues[6, 7, 50-55] and on our own [5658]. Interest in wafer thickness also started at NIST, and the CPM funded us to look at the limits of using wavelength scanning interferometry [11]. In addition to the direct deliverables of the grant [43, 59], we developed a variation that would allow us to measure the thickness of opaque components [60]. Around 2005, the research spread into non-interferometric measurements, with a focus remaining on dimensions or part geometry. In collaboration with professors Dr. Mullany and Dr. Morse in Mechanical Engineering, we secured NSF funding to research combining ideas from remote sensing and engineered optical scattering to realize a new measurement method [61], and a complimentary approach was funded through the Center for Precision Metrology [62]. The work is ongoing and has led to a collection of conference and journal publications[63-68], more publications in progress, and a US patent that is pending [69]. This work was an extension of the structured light expertise I began to build in 2002 on solder bump measurements with Intel [44]. Experience with fringe projection grew in subsequent years with additional funding [70] and publications[45-47]. I have combined the growing expertise in photogrammetry and fringe projection and begun investigating a new type of structured light measurement called deflectometry [10]. One of the main applications will be to measurements of freeform optics, a new class of optical components. UNC Charlotte has teamed up with leading experts at the University of Rochester to start a new research center for freeform optics. The Center for Freeform Optics has recently been awarded funding as an NSF I/UCRC [71, 72]. Dr. Chris Evans and I are the co-directors at UNC Charlotte for the new Center. To date, nine companies and organizations have committed affiliate funding.

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I have also started working on advanced methods for specifying and characterizing the spatial frequency content of a surface [73-79]. This will enable mid-spatial frequency errors to be clearly addressed and this is important for advancing freeform optics technologies.

Research Support Summary My model for research funding is to obtain large government grants for general areas of work and to supplement these with industry-based projects that fit within the larger themes. My motivation is threefold: (1) I enjoy working on industry-based problems where results tend to get used over a relatively short time-scale, (2) graduate students are well-served by learning to work on an industry timeline that requires regular reports and true accountability, and (3) applied research backed up by fundamental theory is the driver for most important contributions in science and engineering. My search for funding has been successful and enable me to support many students and send them to conferences to present their work. Funding history since joining the faculty at UNC Charlotte is summarized in Table 1. The detailed titles and amounts are listed in my vita. The total on grants for which I am the PI is $1.89M and the total on grants for which I am a co-PI is $1.14M. As a co-PI, I tend to have significant involvement in the proposal writing process and subsequent research activities. Combined, the total is just over $3M. Table 1: Summary of research support activity. The funds are separated based on my role as PI or Co-PI. CPM represents the Center for Precision Metrology at UNC Charlotte. Funds as PI Funds as Co-PI Sponsor Digital Optics Corporation $45,450 Northrop-Grumman $5,619 Eastman Kodak $192,736 NIST $24,960 NSF – CAREER, GOALI, IREE, REUs, General Grant $1,152,311 UNC Charlotte $12,000 Research Corporation $35,316 CPM Industrial Affiliates Program (Significant Contribution) Funded Research $413,410 $163,000 NSF I/UCRC Planning Grant, New Center for Freeform Optics $11,500 (Significant Contribution) NSF - MRI and I/UCRC Supplement $550,501 NSF – I/UCRC – Center for Precision (Minor Contribution) Metrology $129,000 NSF - I/UCRC - Center for Freeform (Significant Contribution) Optics (Co-PI, 50%) $300,000 Totals

All Combined Total Edison Welding Institute (PENDING)

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Funds as PI: $1,893,302

Funds as Co-PI: $1,142,501 $3,035,803 (Significant Contribution) $400,000

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Research Career Goals My program has moved increasingly in a direction of collaborative research over the years and will continue to do so. This will involve working with researchers primarily through the Center for Precision Metrology and the Center for Freeform Optics. The work will continue to focus on new measurement techniques, extending existing capabilities, evaluating measurement uncertainty, and researching calibration techniques. Quantifying the limits of a measurement will always be an important component. As technology advances with our ability to manufacturer innovative components with ever-more demanding specifications, the need for metrology research will need to keep pace. The need for ever-more accurate measurements will continue to grow. I envision working in three important areas: (i) structured light measurements, (ii) large component metrology, and (iii) biomedical imaging.

Research Self-evaluation I have been successful at research and obtaining support, and this is noteworthy for my area of expertise - metrology is not a traditional academic research topic. Metrology research is vital to the continued growth in all areas of technology, and the job market is healthy for Ph.D. graduates with this training. I have graduated 6 PhD students, 2 more will defend their dissertation in the coming months, and 1 has recently joined the group. I have graduated 3 M.S. students and had 11 undergraduates working with the graduate students over the years. To date, all of my students have been supported with grant funding. A few years ago, I saw three areas in which I wanted to improve impact. I made changes, and have begun to see the benefits. I will continue with these plans. The three areas are (i) number of journal publications, (ii) large-scale funding programs and (iii) collaborative efforts internal and external to the university.

TEACHING Teaching Personal Statement I find teaching one of the most rewarding aspects of my job. I take pleasure in learning new concepts and developing a physical understanding of the world, and like most things in life, this is more enjoyable if the experience is shared with others. My primary goal is to help students help themselves - to help them develop their own skills to investigate the world and to think critically. I spend a lot of time getting to know and working with students, individually, in small groups, and with the class as a whole. My student evaluations, both formal and informal, are very positive. Above all, students comment on my genuine willingness to help and my ability to explain things in a way they understand (see Appendix B). I have concentrated on two types of classes: the introductory physics course taken by non-majors and upper division/graduate level optics course in support of the optics educational opportunities at Charlotte. I have come to appreciate a strong underlying desire I have to help students exercise and experience their own critical thinking and reasoning ability. I believe this is a basic human capability that brings a natural sense of satisfaction and fulfillment. I thoroughly enjoy sharing in a student’s joy when they realize their own aptitude and efficacy to reason. I always prefer discussions that provide a clear opportunity to reason – a clear critical-thinking path to connect to their physical intuition. I think a student’s joy when they exercise their reasoning and conquer a concept is more than enough stimulation to keep them engaged.

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In the classroom, I work hard to listen to the students and understand their perceptions. I introduce material in non-intimidating ways based on these perceptions, and describe things in their language first, before introducing scientific terms. As sensitive as I am to the importance of teaching this way, it continues to surprise me how often I catch myself inadvertently skipping steps and jumping to technical terms and high-level details too soon. I am always interested in new teaching methods and continuously work to improve between and during semesters. Since coming to Charlotte, I have transitioned to a completely computer-based highly-interactive lecture style. The highlights of my accomplishments and approach are discussed in the “Innovative Activities” section. The courses I have taught, the estimated enrollment (in italics), and the ‘overall instructor effectiveness’ evaluation scores are shown in Appendix B. The evaluations show that my teaching style is well received by the students in general (See Appendix B). My evaluations are respectable and above both Department and College averages most of the time.

Innovative Activities Quite early, I became aware of the importance of genuine communication with the class. Of course this includes presenting the material clearly and keeping the class well-informed of expectations, but perhaps more importantly, it means deeply ‘listening’ in return. Listening is critical to understanding preconceptions and misunderstandings, and accepting how the material must be presented to guide the student to the truth. Deep ‘listening’ and conveying this understanding and respect is very difficult in a large class room – precisely the environment that needs it the most, the introductory courses. My innovations have focused on ways to enhance this ‘listening’ and to present the material in an effective way. Specific examples are given below. Innovations in ‘Listening’ In the Fall of 2004, the department adopted a personal response system in the classroom to engage the students in questions and answers during lecture. Clickers were not yet on campus at the time. There is a great deal of literature showing that active participation during a lecture can dramatically enhance understanding. This was eloquently discussed by Dr. Eric Mazur in a recent presentation at Charlotte, ‘An Active Learning Workshop,’ hosted by the Center for Teaching & Learning (Spring semester 2013). I primarily use the clickers to probe conceptual understanding. I do this several times during a 1.5 hour lecture block. I encourage the students to talk the question over with their neighbor to leverage peer instruction. The first semester of the introductory sequence in physics focuses on motion, and the challenge is ‘undoing’ incorrect preconceptions. Having them actively struggle with their preconceptions and the logical implications is critical for the transition to the correct understanding. The clickers are the most effective tool I know to ‘listen’ to the class. Of course, the quality of the communication entirely depends on the quality of the questions. I continue to discover new ways to ‘question’ the class with every lecture, every semester. In my experience, the clickers change the atmosphere so dramatically that a class of 100 feels like lecturing to a class of 30. I cannot imagine teaching a class now without them. Starting spring semester 2010, I moved back to teaching upper division and graduate optics classes to contribute to the OSE education program. Clickers are not commonly used in upper division and graduate classes, yet the need to and challenges in ‘listening’ are just as important. Rather than formalize a requirement for clickers, I accomplish the same goal by handing out cheap laser pointers to the class (cat toys, actually). I again ask concept-based questions and now students use the laser pointer to point at their choice on the screen in the front of the class. It is a voting of sorts that is anonymous, and the class as a whole sees the ‘histogram’ of their choices by the density of red points on the screen.

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Innovations in Conveying Information My innovations in conveying information center around the use of a computer-based lecture format. By the spring of 2003 I had transitioned entirely to a computer-based lecture style. This allows me to liberally use appropriate animations, simulations, drawings and figures to enhance the learning. I use a tablet PC and project the computer screen onto the overhead screen for the students. This allows me to project the lecture content with excellent visibility and still write out much of the lecture in real time, particularly for working examples in class. I generate pdf files of ‘lecture blanks’ that students can download and/or print out before coming to class. They are the pre-written parts of the lecture and have blank sections for the parts that we work together in class. Many students like these for taking notes. Completed lecture pdf files are then available after class. I believe writing the material rather than going over a prepared PowerPoint presentation is important to keep the pace reasonable and have students follow the lecture. Seeing examples worked by hand is very important, particularly for the introductory courses. By using a table PC and projector, students can see what I write very clearly, I can effectively use color for emphasis, and I can smoothly transition to animations, simulations, annotating figures, etc..

Student Mentoring My student mentoring activities have centered around my advisory roles in the areas of graduate student research and undergraduate mentoring. Students advised are summarized in Appendix B. I have also funded and advised three postdoctoral fellows. I have graduated 6 Ph.D. students and 5 M.S. students, and 2 Ph.D. candidates will defend their dissertations over the next year. Research in my group attracts students from both mechanical engineering and optical science and engineering, with a focus on OSE students in recent years. In addition to my own students, I have served on committees for many M.S. and Ph.D. students, both in Optical Science and Engineering and in Mechanical Engineering. I have mentored and worked with many undergraduates and in recent years a high school student. I actively seek funding to add them to my research group. I organize the workload to have graduate students advising undergraduates and to have undergraduates working together. This gives the graduate students management/mentoring experience and keeps the young students on task.

Teaching Career Goals I have three primary teaching goals: (1) continued involvement in introductory physics instruction, (2) course development on measurement confidence and data analysis, and (3) increase the graduate student journal publication rate. The measurement confidence and data analysis class will be an excellent elective for all STEM students on campus. Increasing the publication rate and writing skills in STEM graduate students is a well-known challenge. I have begun and will continue discussions with the graduate school as I look for creative ways to address the need campus-wide.

Teaching Self-evaluation On a scale of 1-10 (1 = unsatisfactory, 10 = excellent), I rate my overall teaching and mentoring as a 7. I am proud of my accomplishments, and attribute shortcomings to the unsuccessful juggling at times of too many commitments. The number of students in my group grew to large numbers early in my career, and it was difficult to manage. As far as undergraduate teaching, I have changed my approach to teaching the introductory physics courses significantly and am satisfied the changes are in the right direction. I will continue this approach when I pick up teaching PHYS 1101 again. I will continue to teach the upper division Waves and Optics

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course in the years ahead and will continue to move this class in a continually more interactive and conceptually-based direction. As far as graduate classroom instruction, I continue to struggle with the diversity of backgrounds of the OSE students, but continue to adjust curriculum to optimize the content. In terms of graduate student advising, my student time-to-degree and number of graduates is reasonable. At the same time, I feel my advising has room for improvement. I am not satisfied with the rate at which my graduate students achieve technical competence. All too often, I find myself giving them answers to questions they should struggle with on their own, defining the appropriate questions to ask for them, and identifying the next important research steps. I am developing the skill to ask basic questions and to wait patiently for their answer. The questioning always leaves us both with a clearer picture of where they are, what they need to learn, and the skills they need to develop.

SERVICE Service Personal Statement Our Department has gone through many changes since I came to campus in 2001. I, like most in the Department, have worked hard to bring these changes about through service activities. I have served on many committees in the department and at higher levels to support the university growth as a whole. I have been involved in external activities to establish a reputation in my field and help my discipline move forward. My service is summarized in my vitae. I highlight a few of the activities below. Service Internal to the University In summer 2009, I took the service role of Director of the MS and PhD graduate programs in Optical Science and Engineering. This has been a very large time commitment – more than expected. Only in the past year have changes in administrative support and procedures become sufficient to allow me to redirect more attention to teaching and research. These changes have been administrative support and procedural changes at both the OSE program level and the university level. This service activity has benefitted the Department, the College and the University. Since the OSE program’s inception in 2003, by 2009 it had transitioned from a small fledgling program to a significant program on campus, becoming the sixth largest PhD program on campus by 2012. Details about the current status are described in the MS and PhD self-assessment report submitted last year (see Appendix C). The necessary administrative support and infrastructure needed for a small versus large graduate program on this campus is significant. Inadvertently this had not been given proper consideration prior to 2009, and the administrative support and organization for the program was not functioning well. The administrative support is now at the appropriate level with a full-time dedicative administrative assistant, with much gratitude and credit directed to the current Chair of Physics. The program has grown at a steady pace of 3 students per year with a total PhD program size now of ~45. The group of OSE faculty are among the most productive on campus. In terms of faculty governance for the program, my major goals have been to 1) increase the interdisciplinary involvement for the program, 2) improve the number and quality of graduate students, 3) evaluate degree requirements educational needs, and 4) draft and lead the Optics Faculty to passing an agreed upon set of Bylaws for the OSE program. We have made significant progress on all four. Accomplishing the goals began with in-depth investigations into the official resource allocation, policies and procedures on campus for general interdisciplinary programs and for the OSE program, in particular. These define the constraints under which the program functions and the types of change that are possible. I was surprised to learn that very little formal structure is in place. The OSE program pre-dates current

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guidelines for the planning stages for a new PhD program. Current guidelines ensure planners avoid some of the pitfalls the OSE program has experienced. Additional department service activities have varied over the years, from search committees, serving on the review promotion and tenure committee, serving as the Director of the MS in Applied Physics program, to various curriculum development committees efforts. At the college level, I served on the search committee to replace Lesley Brown, our Director of Sponsored Research. At the university level, I have served on interdisciplinary PhD program planning committees such as the Optical Science and Engineering programs early on and later the planning committee for the PhD in Nanoscale Science. I was a member for the Future of the Faculty committee for several years. Service External to the University My service outside of the university has varied. I review articles for journals fairly often, but scaled back this commitment in recent years with the commitment as the Director of the OSE program. This includes reviewing articles for journals such as Optics Express, Optical Engineering, Journal of Strain Analysis for Engineering Design, Precision Engineering, Journal of the Optical Society of America A, Optics Letters Review of Scientific Instruments, and Applied Optics, as examples. I serve on conference program committees fairly regularly, primarily for the SPIE conferences on interferometry, and was a conference program Co-Chair for a summer topical meeting on interferometry through the American Society of Precision Engineering. I served on the education committee for the American Society of Precision Engineers for several years, was invited to and participated in a topical workshop sponsored by NSF and as a results was invited to serve as a guest editor for a special edition on manufacturing for the Journal of Lightwave Technology. I have given several invited seminars since coming to UNC Charlotte. Over the past two years, I have been heavily involved in co-representing UNC Charlotte in an effort to initiate a new NSF-funded I/UCRC Center for Freeform Optics. I am the Co-Director UNC Charlotte with Chris Evans in Mechanical Engineering serving as the other Charlotte Co-Director. This Center has been funded by NSF and will launch Fall 2013. Through this experience, I have been requested by the Optical Society of America to join optics experts and go to Washington DC September 18 and 19 to spread the word about a newly launched National Photonics Initiative (see Appendix C). The goal is to educate members of Congress, through in-district events, media outreach, and one-on-one meetings to lobby for support for the National Photonics Initiative on Capitol Hill.

Service Self-Evaluation Service work involves working with others and agreeing to tasks and deadlines on which others depend. Consequently service often becomes both urgent and important and ends up moving to the top of my To Do pile. I do my best to follow through with these commitments and rate my service accomplishments highly, all things considered. I have learned to be cautious about agreeing to service commitments and find I need to carefully weigh the cost in terms of other goals that intrinsically have less urgency and are vulnerable to compromise. I still often make the mistake of agreeing to too many commitments.

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Davies, A., C. Tarrio, and C. Evans, Advanced optics characterization. Optics and Photonics News, 2001. 12(2): p. 34-37. Evans, C.J., et al., Interferometric figure metrology; enabling in-house traceability, Conference Proceeding for Harnessing Light: Optical Science and Metrology at NIST, August 1, 2001 August 1, 2001, 2001, San Diego, CA, United states: 4450: 81-93, SPIE. Evans, C.J., et al., Interferometric testing of photomask substrate flatness, Conference Proceeding for Metrology, Inspection, and Process Control for Microlithography XV, 26 Feb.-1 March 2001, 2001, USA: 4344: 844-51, SPIE-Int. Soc. Opt. Eng. Parks, R.E., et al., Haidinger interferometer for silicon wafer TTV measurement, Conference Proceeding for Metrology, Inspection, and Process Control for Microlithography XV, February 26, 2001 - March 1, 2001, 2001, Santa Clara, CA, United states: 4344: 496-505, SPIE. Schmitz, T.L., et al., Silicon wafer thickness variation measurements using the National Institute of Standards and Technology infrared interferometer. Optical Engineering, 2003. 42(8): p. 22812290. Schmitz, T.L., A.D. Davies, and C.J. Evans, Uncertainties in interferometric measurements of radius of curvature, Conference Proceeding for Optical Manufacturing and Testing IV, 31 July-2 Aug. 2001, 2001, USA: 4451: 432-47, SPIE-Int. Soc. Opt. Eng. Schmitz, T.L., et al., Displacement uncertainty in interferometric radius measurements. CIRP Annals - Manufacturing Technology, 2002. 51(1): p. 451-454. Funding: Davies, A., CAREER: Self-Calibration Metrology Advances for Micro-Optics Manufacturing, National Science Foundation, $400,000, Award Period: 5/04 - 5/09. Funding: Davies, A., GOALI: A Symmetry-Based Group Theory Approach to Data Reduction for Micro-Optics Manufacturing, National Science Foundation, $236,249, Award Period: 09/03 08/06. Funding: Davies, A. and C. Evans, Evaluation Strategies for Precision Surface Area Measurements, Center for Precision Metrology Industrial Affiliates Program, UNC Charlotte, $57,000, Award Period: 05/13-04/15. Funding: Davies, A., Absolute Distance Metrology with Wavelength-Shifting Interferometry, Center for Precision Metrology Industrial Affiliates Program, UNC Charlotte, $57,500, Award Period: 1/06-9/08. Funding: Davies, A. and F. Farahi, Extending Capabilities for Optical Profilometry, Center for Precision Metrology Industrial Affiliates Program, UNC Charlotte, $52,000, Award Period: 10/10-10/12. Funding: Davies, A., Traceable Evaluation of the Performance of Micro-aspheric Refractive Lenses, Digital Optics Corporation, $9,600, Award Period: 01/03-05/03. Funding: Davies, A., Traceable Evaluation of the Performance of Micro-aspheric Refractive Lenses, Digital Optics Corporation, $35,850, Award Period: 01/02-09/02. Medicus, K.M., et al., Compact interferometer for micro-optic performance and shape characterization, Conference Proceeding for Lithographic and Micromachining Techniques for Optical Component Fabrication II, 3-4 Aug. 2003, 2003, USA: 5183: 85-93, SPIE-Int. Soc. Opt. Eng.

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Gomez, V., et al., Micro-optic reflection and transmission interferometer for complete microlens characterization. Measurement Science and Technology, 2009. 20(2). Davies, A. and N. Gardner, Self-calibration for Micro-Refractive Lens Metrology. Proceedings of the 2005 NSF DMII Grantees Conference, 2005. Gardner, N., T. Randolph, and A. Davies, Self-calibration for micro-refractive lens measurements, Conference Proceeding for Optical Manufacturing and Testing V, August 3, 2003 - August 5, 2003, 2003, San Diego, CA, United states: 5180: 244-252, SPIE. Gardner, N. and A. Davies, Self-calibration for microrefractive lens measurements. Optical Engineering, 2006. 45(3). Gardner, N.W. and A.D. Davies, Ray-trace simulation of the random ball test to improve microlens metrology, Conference Proceeding for Interferometry XIII: Techniques and Analysis, August 14, 2006 - August 16, 2006, 2006, San Diego, CA, United states: 6292: SPIE, SPIE. Bergner, B.C. and A. Davies, Self-calibration for transmitted wavefront measurements. Applied Optics, 2007. 46(1): p. 18-24. Bergner, B.C. and A. Davies, Self-calibration technique for transmitted wavefront measurements, Conference Proceeding for Optical Manufacturing and Testing V, August 3, 2003 - August 5, 2003, 2003, San Diego, CA, United states: 5180: 236-243, SPIE. Davies, A. and B.C. Bergner, A Self-calibration Approach to Transmitted Wave Front Measurements. Proceedings of the 2006 NSF Design, Service, and Manufacturing Grantees and Research Conference, 2006. Karodkar, D., et al., Traceable radius of curvature measurements on a micro-interferometer. Proceedings of the SPIE - The International Society for Optical Engineering, 2004. 5180(1): p. 267-79. Gardner, N. and A. Davies, Retrace error evaluation on a figure-measuring interferometer, Conference Proceeding for Optical Manufacturing and Testing VI, July 31, 2005 - August 1, 2005, 2005, San DIego, CA, United states: 5869: 1-8, SPIE. Zhou, Y., A. Fard, and A. Davies, Characterization of instrument drift using a spherical artifact. Precision Engineering, 2013. In progress. Zhou, Y., Y.-S. Ghim, and A. Davies, Self calibration for slope-dependent errors in optical profilometry by using the random ball test, Conference Proceeding for Interferometry XVI: Techniques and Analysis, August 13, 2012 - August 15, 2012, 2012, San Diego, CA, United states: 8493: The Society of Photo-Optical Instrumentation Engineers (SPIE), SPIE. Zhou, Y., et al., Application of the Random Ball Test for Calibrating Errors in Profilometry Measurements. Applied Optics, 2013. 52: p. 5925-5931. Davies, A., B. Bergner, and N. Gardner, Improving metrology for micro-optics manufacturing, Conference Proceeding for Gradient Index, Miniature, and Diffractive Optical Systems III, August 6, 2003 - August 7, 2003, 2003, San Diego, CA, United states: 5177: 67-81, SPIE. Gardner, N., A. Davies, and B. Bergner, Measurement advances for micro-refractive fabrication, Conference Proceeding for Nano- and Micro-Metrology, June 16, 2005 - June 17, 2005, 2005, Munich, Germany: 5858: 1-8, SPIE. Davies, A. and S.A. Gugsa, A Least-squares Minimization and Monte Carlo Approach to Estimating the Conic Constant and Uncertainty for Microlens Measurements. Proceedings of the 2006 NSF Design, Service, and Manufacturing Grantees and Research Conference, 2006. Gugsa, S.A. and A. Davies, Monte Carlo analysis for the determination of the conic constant of an aspheric micro lens based on a scanning white light interferometric measurement, Conference Proceeding for Advanced Characterization Techniques for Optics, Semiconductors, and

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Nanotechnologies II, August 2, 2005 - August 4, 2005, 2005, San Diego, CA, United states: 5878: 1-11, SPIE. Gugsa, S.A. and A. Davies, A Simulation Package for Evaluating Interferometric Micro-Aspheric Lens Measurements. Proceedings of the 2005 NSF DMII Grantees Conference, 2005. Medicus, K.M., et al., Interferometric measurement of phase change on reflection. Applied Optics, 2007. 46(11): p. 2027-2035. Medicus, K.M., et al., The effect of phase change on reflection on optical measurements, Conference Proceeding for Recent Developments in Traceable Dimensional Measurements III, July 31, 2005 - August 1, 2005, 2005, San Diego, CA, United states: 5879: 1-12, SPIE. Medicus, K.M., et al., The Effect of Phase Change on Reflection on Optical Measurements. Proceedings of the ASPE Annual Meeting, 2004. Funding: Davies, A., Fundamental Investigations of the Phase Change on Reflection of Light, Research Corporation, $35,316, Award Period: 06/03 -05/05. Purcell, D., et al., Interferometric technique for faceted microstructure metrology using an index matching liquid. Applied Optics, 2010. 49(4): p. 732-738. Funding: Davies, A., International Research and Education in Engineering Supplement to CAREER Grant: Advancing Metrology for Micro-Optics Manufacturing Through an International Collaboration with the Vrije Universiteit Brussel (VUB) National Science Foundation, $28,000, Award Period: 05/07-05/08. Ghim, Y.-S. and A. Davies, Complete fringe order determination in scanning white-light interferometry using a Fourier-based technique. Applied Optics, 2012. 51(12): p. 1922-1928. Ghim, Y.-S., A. Suratkar, and A. Davies, Reflectometry-based wavelength scanning interferometry for thickness measurements of very thin wafers. Optics Express, 2010. 18(7): p. 6522-6529. Ghim, Y.-S., et al., Absolute thickness measurement of silicon wafer using wavelength scanning interferometer, Conference Proceeding for Dimensional Optical Metrology and Inspection for Practical Applications, August 22, 2011 - August 23, 2011, 2011, San Diego, CA, United states: 8133: The Society of Photo-Optical Instrumentation Engineers (SPIE), SPIE. Suratkar, A., Y.-S. Ghim, and A. Davies, Uncertainty analysis on the absolute thickness of a cavity using a commercial wavelength scanning interferometer, Conference Proceeding for Interferometry XIV: Techniques and Analysis, August 11, 2008 - August 13, 2008, 2008, San Diego, CA, United states: 7063: The International Society for Optical Engineering (SPIE), SPIE. Funding: Davies, A. and F. Farahi, Evaluating and Improving Metrology for Arrays of Solder Bumps, Center for Precision Metrology Industrial Affiliates Program, UNC Charlotte, $42,000, Award Period: 09/02-12/04. Samara, A., F. Farahi, and A. Davies, Dynamic range enhancing technique for form, waviness and roughness measurements using fringe projection, Conference Proceeding for Recent Developments in Traceable Dimensional Measurements III, July 31, 2005 - August 1, 2005, 2005, San Diego, CA, United states: 5879: 1-12, SPIE. Purcell, D., et al., Systematic bias compensation for a moire fringe projection system, Conference Proceeding for Recent Developments in Traceable Dimensional Measurements III, 31 July 2005, 2005, USA: 5879: 587909-1, SPIE - The International Society for Optical Engineering. Purcell, D., A. Davies, and F. Farahi, Effective wavelength calibration for moire fringe projection. Applied Optics, 2006. 45(34): p. 8629-8635. Funding: Davies, A., Three-flat Testing and Radius of Curvature Metrology, National Institute of Standards and Technology, $24,960, Award Period: 03/02-08/03.

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Funding: Davies, A., Improving Measurements Based on the Cat’s Eye Reflection, Center for Precision Metrology Industrial Affiliates Program, UNC Charlotte, $71,500, Award Period: 09/02-09/05. Davies, A. and T.L. Schmitz, Correcting for stage error motions in radius measurements. Applied Optics, 2005. 44(28): p. 5884-5893. Davies, A. and T.L. Schmitz, Defining the measurand in radius of curvature measurements, Conference Proceeding for Recent Developments in Traceable Dimensional Measurements II, August 4, 2003 - August 6, 2003, 2003, San Diego, CA, United states: 5190: 134-145, SPIE. Schmitz, T. and A. Davies, Radius of Curvature Uncertainty: Nonlinear Measurand and Treatment, Conference Proceeding for American Society of Precision Engineering Uncertainty Analysis in Measurement and Design Summer Topical Meeting, 2004, State College, PA: 78-82. Schmitz, T., C.J. Evans, and A. Davies, An investigation of uncertainties limiting radius measurement performance, Conference Proceeding for American Society for Precision Engineering Spring Topical Meeting on Precision Interferometric Metrology, 2000. Schmitz, T.L., et al., Improving optical bench radius measurements using stage error motion data. Applied Optics, 2008. 47(36): p. 6692-6700. Schmitz, T.L., et al., Radius case study: Optical bench measurement and uncertainty including stage error motions, Conference Proceeding for Recent Developments in Traceable Dimensional Measurements III, July 31, 2005 - August 1, 2005, 2005, San Diego, CA, United states: 5879: 111, SPIE. Medicus, K.M., J. Snyder, and A.D. Davies, Gaussiam beam modeling of the radius of curvature, Conference Proceeding for Recent Developments in Traceable Dimensional Measurements III, July 31, 2005 - August 1, 2005, 2005, San Diego, CA, United states: 5879: 1-9, SPIE. Medicus, K.M., J.J. Snyder, and A. Davies, Modeling the interferometric radius measurement using Gaussian beam propagation. Applied Optics, 2006. 45(34): p. 8621-8628. Medicus, K.M., J. Synder, and A.D. Davies, Gaussian Beam Modeling of the Radius of Curvature. Proceedings of the ASPE 2005 Summer Topical Meeting, Precision Interferometric Metrology, 2005. Suratkar, A., A. Davies, and F. Farahi, Absolute Length (Thickness) Measurements Using Wavelength Scanning Interferometry. Conference Proceedings American Society for Precision Engineering Annual Meeting, 2008. Suratkar, A.R., A.D. Davies, and F. Farahi, New interferometric technique to measure the length (thickness) of opaque objects using a commercial interferometer, Conference Proceeding for Optical Manufacturing and Testing VII, August 28, 2007 - August 29, 2007, 2007, San Diego, CA, United states: 6671: The International Society for Optical Engineering (SPIE), SPIE. Funding: Davies, A., B. Mullany, and E. Morse, In Situ Form Metrology in Manufacturing by Combining Engineered Optical Scattering and Photogrammetry, National Science Foundation, $464,062, Award Period: 8/09-7/13. Funding: Mullany, B., A. Davies, and E. Morse, 6DOF Sensor using Optical Scattering and Photogrammetry, Center for Precision Metrology Industrial Affiliates Program, UNC Charlotte, $99,000, Award Period: 06/09-05/12. Zheng, B., et al., Using optical projection in close-range photogrammetry for 6DOF sensor positioning. Photogrammetric Engineering and Remote Sensing, 2013. 79(1): p. 79-86. Zheng, B., et al., Positioning Sensor by Combining Photogrammetry, Optical Projection and a Virtual Camera Model. Measurement Science and Technology, 2013. 24: p. 105106-105114.

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Zheng, B., et al., Position Sensing Module by Combining Photogrammetry and Projection Pattern. Proceedings of the 26th Annual Meeting of the American Society for Precision Engineering, 2011. Bowes, K.E., et al., Form Measurements of Specular Parts by Combining Beam Propagation, Optical Scattering, and Photogrammetry. Proceedings of the 26th Annual Meeting of the American Society for Precision Engineering, 2011. Dong, Y., et al., Using 3D optical simulation to investigate uncertainty in image-based measurement. Precision Engineering, 2013. In progress. Dong, Y., et al., Using an optical software package to analyze photogrammetry system errors. Proceedings of the 26th Annual Meeting of the American Society for Precision Engineering, 2011. Davies, A., et al., Improved Dimensional Measurement Through a Combination of Photogrammetry and Optical Scattering, US Patent, Application Number 13/118,969, Patent Pending, March 1, 2012. Funding: Davies, A. and F. Farahi, Construction and Error Analysis of a Fringe Projection System, Center for Precision Metrology Industrial Affiliates Program, UNC Charlotte, $43,400, Award Period: 09/03-09/05. Funding: Davies, A. and C. Evans, Planning Grant: I/UCRC for Freeform Optics, National Science Foundation, $11,500, Award Period: 07/12-06/13. Funding: Davies, A. and C. Evans, Industry/University Cooperative Research Centers Program (I/UCRC) - Center for Freeform Optics, National Science Foundation, $300,000, Award Period: 09/13-08/18. He, L., A. Davies, and C.J. Evans, Comparison of the area structure function to alternate approaches for optical surface characterization, Conference Proceeding for Interferometry XVI: Techniques and Analysis, August 13, 2012 - August 15, 2012, 2012, San Diego, CA, United states: 8493: The Society of Photo-Optical Instrumentation Engineers (SPIE), SPIE. He, L., C.J. Evans, and A. Davies, Optical surface characterization with the area structure function. Annuls of the CIRP, 2013. 62: p. 539-542. He, L., C.J. Evans, and A. Davies, Two-quadrant area structure function analysis for optical surface characterization. Optics Express, 2012. 20(21): p. 23275-23280. Funding: Evans, C. and A. Davies, Multi-instrument surface characterization using the 3D structure function, Center for Precision Metrology Industrial Affiliates Program, UNC Charlotte, $64,000, Award Period: 01/10-12/12. He, L., C. Evans, and A. Davies, Surface characterization with the area structure function. Proceedings of the 14th International Conference on the Metrology and Properties of Engineering Surfaces, 2013. He, L., C. Evans, and A. Davies, Characterizing optical surfaces using the area structure function. Proceedings of the OSA Optical Fabrication and Testing Workshop, 2012. Optical Testing I (OTu1D), Optics Infobase. He, L., C.J. Evans, and A. Davies, Single and Multiple-instrument Surface Characterization with the Area Structure Function. Proceedings of the American Society of Precision Engineering, 2012. 54: p. 488-491.

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