Cut-off Frequency Enhanced Hybrid Electromagnetic Bandgap (EBG) Structures with Wideband Noise Suppression Characteristics

Ki Hyuk Kim, Pavle Milosevic, and José E. Schutt-Ainé Department of Electrical and Computer Engineering, University of Illinois, Urbana, IL 61801 USA E-mail: {khkim, pavle, jschutt}@emlab.uiuc.edu Abstract: A cut-off frequency characteristic enhanced hybrid EBG structure is proposed. In the proposed EBG structure, inductive bridges between neighboring metal patches are designed using lumped chip inductors instead of conventional microstrip lines. From 75 MHz to 4830 MHz a stopband bandwidth of 4.755 GHz is achieved at a -30 dB noise suppression level.

Introduction Due to continuous increase of CMOS device cut-off frequencies (fTs) single chip integrations of high speed mixed-signal systems are widely researched. One of the design and testing issues of such high speed mixed-signal designs is the simultaneous switching noise (SSN) coupling through solid power/ground plane pairs. The increased operating speed of digital blocks results in large SSN, which degrades not only the noise margins of digital circuits, but also the performance of analog circuits. At PCB/package level, the generated SSN can propagate through parallel plate waveguides which are formed by the solid power/ground plane pairs. In order to suppress the noise coupling at the PCB/package level, Wu et al. used a uniplanar EBG structure in the design of the power/ground plane pairs [1]. The uniplanar EBG structure consists of a 2-dimensional array of metal patches and microstrip line bridges between the neighboring patches. Wu’s EBG structure showed a wideband noise suppression characteristic with a 3 GHz stopband bandwidth, however, due to low inductance of the bridges the stopband cut-off frequency of the EBG structure was around 1 GHz. In order to reduce the cut-off frequency, several high inductance microstrip line bridges are proposed [2], [3]. However, the lowest cut-off frequency of the previously reported EBG structures is around 300 MHz, which is still higher than the clock frequencies of current mixed-signal systems. In this work, an EBG structure with VHF-band cut-off frequency is proposed by replacing the microstrip line bridges with lumped chip inductors. A onedimensional analysis model is developed to provide the mathematical foundation for the use of lumped chip inductors in the EBG structure design. One-Dimensional Analysis of Planar EBG Structure Fig. 1 shows a one-dimensional equivalent circuit of the planar EBG structure, where a and g are the center-to-center distance and the gap size between

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(i-1)th Cell

(i+1)th Cell

ith Cell Cgap

b

LP/2

LP/2

CP/2

CP/2

LL

Cparasitics

b

LP/2 CP/2

g d

a ith Patch

Bridge

εr

(i+1)th Patch

Fig. 1. One-dimensional Equivalent Circuits of the EBG structure

two neighboring patches, respectively, b is the width of the rectangular patches, and d is the height of the dielectric substrate. LP and CP are the inductance and the capacitance of each square metal patch, respectively, LL is the inductance of the bridge, and CT is the series parasitic capacitance between two patches including the gap capacitance (Cgap) and the parasitic capacitance of the bridge (Cparasitics). LP, CP, and Cgap can be calculated using published quasi-static models [4]. Cparasitics varies depending on the physical implementation of the bridges, and typical values of Cparasitics for lumped chip inductors are less than 0.24 pF [5]. Cgap is larger than Cparasitics under the condition that b⋅(1+εr) is larger than Cparasitics⋅(118.6e+12) mm for the EBG structures with g=0.1⋅a. For the 0.24 pF series parasitic capacitance, the calculated value of Cparasitics⋅(118.6e+12) is 28.5 mm, which is only 22.6 % of the calculated values of b⋅(1+εr) using parameters of the previous EBG structures [1–3]. The capacitances ratio Cgap/CP is very small for typical PCB/package structures, since the values of b are much larger than those of d. The typical value of d is in the range of 0.4 – 1.6 mm, and the width of the patches is around 30 mm [1–3]. By applying the image parameter method [4] and the above two capacitance ratios, the lower (flower) and upper (fupper) cut-off frequencies of Fig. 1 can be derived as

[

f lower = π C P (LP + LL )

[

]

−1

f upper = 2π CT C P LP (4CT + C P )

(1)

]

−1

.

(2)

flower and fupper are not related to CT and LL, respectively. That is, although lumped chip inductors have low self resonant frequencies (SRFs) due to their series parasitic capacitances, the cut-off frequency of the EBG structure can be lowered by using the high inductance chip inductors as the bridges. And the replacements cause no degradation of the other high frequency characteristics.

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Design and Experimental Verification of Proposed Hybrid EBG Structure Fig. 2 (a) shows the fabricated hybrid EBG structure. In order to directly compare the noise suppression performances, physical dimensions and port locations of the proposed EBG structure are the same with those of reference [2], and captioned in the figure. The thickness and the dielectric constant of the substrate are 0.4 mm and 4.4, respectively, and Coilcraft, Inc., 0603LS-561X 560 nH chip inductors are used as the bridges instead of the microstrip lines. (a)

(b) y [mm] x [mm]

(c)

Var Eqn

12×12 array of T-models

L L1 L=lp_2 R=

(74, 74)

Inductor bridge

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X1 X2 X5 X8 X9 X12 X13 X16 X17 X20 X21 X24

Port 2

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X3 X4 X6 X7 X10 X11 X14 X15 X18 X19 X22 X23

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X28 X25 X29 X32 X33 X36 X37 X40 X41 X44 X45 X48

(46, 45) (74, 45) Port 1 Port 3

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X27 X26 X30 X31 X34 X35 X38 X39 X42 X43 X46 X47

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X76 X73 X77 X80 X81 X84 X85 X88 X89 X92 X93 X96

VAR VAR1 cp=.55339e-12 lp_2=.25133e-9 rp_2=8.6207e-4

L L2 L=lp_2 R=

Port P1 Num=1

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X75 X74 X78 X79 X82 X83 X86 X87 X90 X91 X94 X95

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X51 X50 X54 X55 X58 X1323 X62 X63 X66 X67 X70 X71

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X123 X122 X126 X127 X130 X131 X134 X135 X138 X139 X142 X143

Port P3 Num=3

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X100 X97 X101 X104 X105 X108 X109 X112 X113 X116 X117 X120

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X99 X98 X102 X103 X106 X107 X110 X111 X114 X115 X118 X119

C C87 C=cgap

C C88 C=cgap

R R3 R=rp_2

Port P2 Num=2

C C89 C=cgap

T-model

(e) 1st order LC model

(d) 12-section distributed capacitance models C C86 C=cgap

L L3 L=lp_2 R=

Y1P_Eqn Y1P1 Y[1,1]=freq*cp*tan(0.02)

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X124 X121 X125 X128 X129 X132 X133 X136 X137 X140 X141 X144

b=28.7mm

C C85 C=cgap

L L4 L=lp_2 R=

C C1 C=cp

R R2 R=rp_2

Tmodel_1cellTmodel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTmodel_1cellTm odel_1cellTm odel_1cellTmodel_1cellTmodel_1cellTmodel_1cell X52 X49 X53 X56 X57 X60 X61 X64 X65 X68 X69 X72

g=1.3mm a=30mm

R R1 R=rp_2

Port P4 Num=4 R R4 R=rp_2

C inductor_symb_560nH C C C90 X1312 C91 C92 C=cgap C=cgap C=cgap

C C93 C=cgap

C C94 C=cgap

C C95 C=cgap

C C96 C=cgap

Port P1 Num=1

C C1 C=0.16 pF

Port P2 Num=2

L L1 L=560 nH

Fig. 2. Schematic of Proposed EBG PDN and corresponding ADS simulation models

Fig. 2 (b) to (e) show the ADS simulation models for the patches, the gaps, and the lumped chip inductors, respectively. The 2-dimensional array of distributed RLCG element method [6] is used to model the patches. 12-section distributed C models and 1st-order parallel LC models are used to model the gap capacitances and the lumped chip inductors, respectively. Parasitic series capacitances of the chip inductors are calculated from the self resonant frequencies (SFRs) of the lumped chip inductors in datasheets [5]. Fig. 3 shows simulated and measured insertion loss responses of the proposed and the reference EBG structures [2]. An Agilent E8358A PNA Series Network Analyzer is used to measure the S-parameters, and for brevity of figure only |S21| responses are plotted. The open circles represent the measured |S21| response of a structure without the EBG structure, while open and solid rectangles represent simulated and measured |S21| responses of the proposed EBG structure, respectively. The reference EBG structure [2] is simulated using Ansoft HFSS, and the solid circles represent simulated |S21| responses. The calculated, simulated and measured cut-off frequencies of the proposed structure are 47.5, 49.2 and 47.2 MHz, respectively. The measured stopband bandwidth of the proposed EBG structure at the -30 dB noise suppression level is 4755 MHz (75 – 4830 MHz), while the simulated stopband bandwidth of the reference EBG structure is only 4325 MHz (555 – 4875 MHz).

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Conclusions In this work, a hybrid EBG structure with a cut-off frequency of 47.2 MHz and a noise suppression bandwidth of 4.755 GHz is proposed by using lumped chip inductors instead of microstrip lines. The stopband bandwidth is enhanced by more than 430 MHz and the enhancement can be further increased by using higher values of chip inductors. The 1-dimensional analysis model and the ADS circuit level simulation models are also developed for the proposed EBG structure. The simulated and measured |S21| responses of the proposed EBG structure are in substantial agreement with each other. Measurement: Solid Plane HFSS Simulation: ref. [2] EBG ADS Simulation: Proposed EBG Measurement: Proposed EBG

Insertion Loss [dB]

0 -20

Stopband bandwidth (-30 dB suppression)

-40

Enhanced Suppression BW

-60 -80 0

1

2

3

4

5

Frequency [GHz] Fig. 3. |S21| Insertion Loss Characteristics of the Proposed EBG Structure

References: [1] T.-L. Wu, et al., “A novel Power Planes with Low Radiation and Broadband Suppression of Ground Bounce Noise using Photonic Bandgap Structures,” IEEE Microw. Wireless Comp. Lett, vol. 14, no. 7, July 2004. [2] T.-L.Wu, et al., “A novel power plane with super-wideband elimination of ground bounce noise on high speed circuits,” IEEE Microw. Wireless Comp. Lett., vol. 15, no. 3, pp. 174–176, Mar. 2005. [3] X.-H. Wang, et al., “A Novel Uniplanar Compact Photonic Bandgap Power Plane with UltraBroadband Suppression of Ground Bounce Noise,” IEEE Microw. Wireless Comp. Lett., vol. 16, no. 5, May 2006. [4] Jinwoo Choi, “Noise Suppression and Isolation in Mixed-Signal Systems using Alternating Impedance Electromagnetic Bandgap (AI-EBG) Structure,” Ph. D. dissertation, School of Electrical and Computer Engineering, Georgia Institute of Technology, Dec. 2005. [5] Coil Craft, Inc., Datasheets, [Online] Available: http://www.coilcraft.com, 2007. [6] Larry D. Smith et al., “Power Plane SPICE Models and Simulated Performance for Materials and Geometries,” IEEE Trans. Adv., Packag., vol. 24, pp. 277-287, Aug. 2001.

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(EBG) Structures with Wideband Noise Suppression ...

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